BIS Norms to Speed up Electronics, IT hardware Scheme (CRS)

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BIS Norms to Speed up Electronics, IT hardware Scheme (CRS)
By Evtl India

BIS Norms to Speed up Electronics, IT hardware Scheme (CRS)

New BIS norms to speed up electronics, IT hardware Companies' compliance process

On January 9, BIS announced that a pilot project of parallel testing for certain electronics goods would be institutionalized as a permanent provision. This project covered 64 products under the Compulsory Registration Scheme (CRS)ред Manufacturers can choose parallel testing on their own, while those who prefer traditional sequential testing can continue to do so

New Delhi: Electronics and IT hardware manufacturers can save up to 4 to 13 weeks in the process by implementing parallel testing of their products by complying with the recent guidelines issued by the Bureau of Indian Standards (BIS), an industry body said.

BIS on January 9 announced that the pilot project on parallel testing for select electronics goods will be institutionalized as a permanent provision, covering a total of 64 products under the Compulsory Registration Scheme (CRS).

Manufacturers may voluntarily opt for parallel testing, while those preferring the traditional sequential method may continue to do so.

Suhail Zaidi, director general of industry body MAIT, said, “Voluntary adoption of parallel testing not only streamlines the compliance process for manufacturers, but also significantly accelerates the go-to-market strategy compared to the traditional sequential testing method. "

He said the process increases the speed of doing business, allowing companies to introduce cutting-edge products to consumers more quickly.

MAIT had previously found that adopting a parallel testing methodology could save the industry 4 to 13 weeks in the compliance process.

BIS had issued guidelines for parallel testing in December 2022 for mobile phones as a pilot project for six months, which was later extended to wireless earphones and headphones, laptops, notebooks and tablets.

Under the parallel testing method, all the components requiring registration can be sent for testing in parallel to any BIS laboratory. The laboratory will test the first component and issue a test report, which will be mentioned in the test report of the second component, and will be followed for subsequent components and the final product.

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